MFR #:923-0.3-DIP
EIS #:PH16-923-0.3-DIP
Series #:923-0.3-DIP
MFR #:923-0.3-DIP
EIS #:PH16-923-0.3-DIP
Series #:923-0.3-DIP
3M IC test clips are available in both nail head leads to accommodate a wide range of applications. They also feature heavy duty helical compression springs to provide firm and positive contact pressure and use steel hinge pins and tough glass filled polyester bodies, UL rated 94V-0, to provide long service life. 3M IC test clips have an insulating contact comb to help prevent accidental shorts and feature a patented "wiping action" to ensure integrity during testing. - 3M IC test clip is a standard thru-hole test clip with nail head leads. Hard-to-access surface mount ICS can be connected to test probes and logical assemblies quickly and easily without the risk of shorting out clips or damaging other board components. Test clip features alloy gold plating, heavy duty helical compression springs and insulating contact comb.
Select from the options below
3M IC test clips are available in both nail head leads to accommodate a wide range of applications. They also feature heavy duty helical compression springs to provide firm and positive contact pressure and use steel hinge pins and tough glass filled polyester bodies, UL rated 94V-0, to provide long service life. 3M IC test clips have an insulating contact comb to help prevent accidental shorts and feature a patented "wiping action" to ensure integrity during testing. - 3M IC test clip is a standard thru-hole test clip with nail head leads. Hard-to-access surface mount ICS can be connected to test probes and logical assemblies quickly and easily without the risk of shorting out clips or damaging other board components. Test clip features alloy gold plating, heavy duty helical compression springs and insulating contact comb.
Product Options
Showing 5 out of 5 options
Type: Through-Hole, DIP, 24 Pin | EIS Part #: 923715 | $ / each | ||
Type: Through-Hole, DIP, 20 Pin | EIS Part #: 923704 | $ / each | ||
Type: Through-Hole, DIP, 18 Pin | EIS Part #: 923703 | $ / each | ||
Type: Through-Hole, DIP, 14 Pin | EIS Part #: 923698 | $ / each | ||
Type: Through-Hole, DIP, 8 Pin | EIS Part #: 923695 | $ / each |
- Attributes
- Features
- Applications
Attributes
General Information
Item NameTest Clip
Series923-0.3-DIP
Design & Construction
Contact FinishGold Plated
Contact MaterialCopper
MaterialGlass Filled Polyester Body, Steel Hinge Pin
Features
- Test devices down to 0.05 Inch center to center lead spacing
- All four sides of test clip open simultaneously for one step attachment to PLCC being tested
- Stays securely clamped to PLCC
- Helical compression springs and insulating contact combs ensure contact integrity during testing
- Probe access points are immediately visible for fast and save individual lead testing
- Staggered contact rows on 0.1 Inch centers facilitate probe attachment and help prevent accidental shorting of adjacent probes
- Industry standard 0.025 Inch square contact pins on the 0.1 Inch centers easily accept single row socket connectors
- Because of positive attachment to device, test clip will not "fall off" when board is vertical and test probes are hung off the pins
- Nail Head
Applications
- For In-Circuit IC Testing