MFR #:923-DIP-L
EIS #:PH16-923-DIP-L
Series #:923-DIP-L
MFR #:923-DIP-L
EIS #:PH16-923-DIP-L
Series #:923-DIP-L
3M narrow nose shape allows work on high density PC boards. By attaching the test clip to a DIP IC, previously hard-to-reach leads are made easily accessible to test probes without fear of shorting out valuable chips. Fits into ICS with only 0.1 Inch between leads and adjacent components. Nail-head pins keep probes and test leads from sliding off. - 3M heavy duty metal springs provide a firm, positive grip to the DIP under test, unlike other all-plastic versions. Flat "duck-bill" contacts won't roll off narrow DIP leads, allowing for optimum reliability. Body material is tough, engineering grade acetyl thermoplastic. Test leads are made of Alloy 770.
Select from the options below
3M narrow nose shape allows work on high density PC boards. By attaching the test clip to a DIP IC, previously hard-to-reach leads are made easily accessible to test probes without fear of shorting out valuable chips. Fits into ICS with only 0.1 Inch between leads and adjacent components. Nail-head pins keep probes and test leads from sliding off. - 3M heavy duty metal springs provide a firm, positive grip to the DIP under test, unlike other all-plastic versions. Flat "duck-bill" contacts won't roll off narrow DIP leads, allowing for optimum reliability. Body material is tough, engineering grade acetyl thermoplastic. Test leads are made of Alloy 770.
Product Options
Showing 4 out of 4 options
Type: Through-Hole, DIP, Long Wire, 48 Pin | EIS Part #: 923739-48 | $ / each | ||
Type: Through-Hole, DIP, Long Wire, 24 Pin | EIS Part #: 923690-24 | $ / each | ||
Type: Through-Hole, DIP, Long Wire, 18 Pin | EIS Part #: 923690-18 | $ / each | ||
Type: Through-Hole, DIP, Long Wire, 14 Pin | EIS Part #: 923690-14 | $ / each |
- Attributes
- Features
- Applications
Attributes
General Information
Item NameTest Clip
Series923-DIP-L
Design & Construction
MaterialGlass Filled Polyester Body, Steel Hinge Pin
Contact FinishGold Plated
Contact MaterialCopper
Features
- Test devices down to 0.05 Inch center to center lead spacing
- All four sides of test clip open simultaneously for one step attachment to PLCC being tested
- Stays securely clamped to PLCC
- Helical compression springs and insulating contact combs ensure contact integrity during testing
- Probe access points are immediately visible for fast and save individual lead testing
- Staggered contact rows on 0.1 Inch centers facilitate probe attachment and help prevent accidental shorting of adjacent probes
- Industry standard 0.025 Inch square contact pins on the 0.1 Inch centers easily accept single row socket connectors
- Because of positive attachment to device, test clip will not "fall off" when board is vertical and test probes are hung off the pins
Applications
- For In-Circuit IC Testing